ZAPATA CLAVERÍA, M. Fear and technological risk in the philosophical catastrophism of Jean Pierre Dupuy and Paul Virilio. ArtefaCToS. Revista de estudios sobre la ciencia y la tecnología, [S. l.], v. 7, n. 1, p. 155–173, 2018. DOI: 10.14201/art201871155173. Disponível em: https://revistas.usal.es/cinco/index.php/artefactos/article/view/art201871155173. Acesso em: 17 jun. 2024.